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Chip Manufacturing

Defect Inspection Review
Deposition
Etch
In Situ Process Management - Chip Manufacturing
Metrology 1
Metrology 2
Metrology 3

Wafer Manufacturing

Defect Inspection and Review
Metrology
In Situ Process Management - Wafer Manufacturing

Reticle Manufacturing

Defect Inspection
In Situ Process Monitoring
Metrology

Packaging Manufacturing

Die Sorting and Inspection
IC Component Inspection and Metrology
Wafer Inspection and Metrology
Wafer Processing Systems
In Situ Process Management - Packaging Manufacturing

PCB and IC Substrate Manufacturing

Automated Optical Shaping
Direct Imaging for Patterning
Direct Imaging for Solder Mask
Inkjet and Additive Printing
Panel Inspection and Metrology
UV Laser Drilling

Software Solutions

PCB Software Solutions
Semiconductor Software Solutions

Other Industries

Hard Disk Drive Manufacturing
Solar Manufacturing
University and Industry Research

OEM

Capacitive Sensors

Instruments

Profilers & Nanomechanical

Instruments
Stylus Profilers
Optical Profilers
Nanomechanical Testers
Thin-Film Reflectometers
Defect Inspectors
Other - Stylus
Other - Optical
Other - Nanoindeter
Other - Thin Film
Other - Defect Inspectors
Other - Sheet Resistance Mappers
Other - Service

Either UTID or Serial Number is required

Is your tool currently in production?

Does your company currently supply products or services to KLA

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선택사항

Data Transfer
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